| Extended-Path Intensity Correlation (EPIC) |
| Ken Van Tillburg, New York University |
 Event Type: Astro Seminar |
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| Time: 2:00 PM - 3:15 PM |
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| Location: 726 Broadway, 940, CCPP Seminar |
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| Abstract: I will introduce a conceptually new astronomical technique---extended-path intensity correlation (EPIC)---and discuss its scientific applications.
EPIC is a variant of intensity interferometry wherein an optical-path modification creates a path extension in the two-photon interference amplitude. This alteration generates interference fringes for widely separated sources, allowing maximum source separations parametrically larger than the angular resolution. Augmented with advances in single-photon detectors and spectroscopic gratings, EPIC would enable ground-based astrometry at microarcsecond-level precision in a field of view as large as several arcseconds. EPIC has the potential to revolutionize astrophysical and cosmological observations requiring high-precision differential astrometry on sources of high surface brightness.
I will lay out the theory, technical requirements, and science case for EPIC. Promising applications include dark matter substructure studies using astrometric microlensing of quasar images; cosmic distance ladder calibration; binary-orbit characterization; exoplanet detection; Galactic acceleration measurements; all potentially at unprecedented relative astrometric precision. |